Title :
Survey of noise in semiconductor diodes and triodes
Author_Institution :
RCA Laboratories, Princeton, NJ, USA
Abstract :
Summary form only given. Shot noise in semiconductor diodes and triodes is white at low frequencies and increases at high frequencies. The simple assumption that fluctuations in electron-hole-pair creations, motions, and recombinations are perfectly random permits a satisfactory understanding of this noise.
Keywords :
Admittance; Fluctuations; Low-frequency noise; Radiative recombination; Semiconductor device noise; Semiconductor diodes; Spontaneous emission; Transducers;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1958 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1958.1155616
