• DocumentCode
    2862176
  • Title

    Survey of noise in semiconductor diodes and triodes

  • Author

    Fonger, W.

  • Author_Institution
    RCA Laboratories, Princeton, NJ, USA
  • Volume
    I
  • fYear
    1958
  • fDate
    20-21 Feb. 1958
  • Firstpage
    15
  • Lastpage
    15
  • Abstract
    Summary form only given. Shot noise in semiconductor diodes and triodes is white at low frequencies and increases at high frequencies. The simple assumption that fluctuations in electron-hole-pair creations, motions, and recombinations are perfectly random permits a satisfactory understanding of this noise.
  • Keywords
    Admittance; Fluctuations; Low-frequency noise; Radiative recombination; Semiconductor device noise; Semiconductor diodes; Spontaneous emission; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1958 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1958.1155616
  • Filename
    1155616
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2862176