Title :
Linear-selection, core-memory techniques using transistors
Author_Institution :
MIT Lincoln Laboratory, Lexington, MA, USA
Abstract :
Presents an abstract of the conference paper.
Keywords :
Inductance; Switches; Voltage; Wiring; Yarn;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1958 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1958.1155619