DocumentCode
2862316
Title
Effect of nanocrystalline TiO2 scattering layer on the photoelectrode of dye-sensitized solar cells
Author
Meen, Teen-Hang ; Water, Walter ; Hong, Jhih-Hao ; Ji, Liang-Wen ; Tsai, Jenn-Kai ; Liu, Yu-Sung ; Huang, Chien-Jung
Author_Institution
Dept. of Electron. Eng., Nat. Formosa Univ., Yunlin, Taiwan
fYear
2011
fDate
21-24 June 2011
Firstpage
1
Lastpage
2
Abstract
The study is to investigate that the effects of nanocrystalline TiO2 scattering layer on the photoelectrode of the dye-sensitized solar cells (DSSCs). In the analysis of field emission scanning electron microscopy (FE-SEM), TiO2 thin films prepared by electrophoresis deposition (EPD) have the porous nanocrystalline structure. The analysis of UV-Vis spectrophotometer indicates that the absorption wavelength of electrode with scattering layer can be obviously promoted from ultraviolet to visible light. In the analysis of electrochemical impedance spectroscopy (EIS), the value of Teff (lifetime of an electron in TiO2) increases from 0.0395 to 0.0515 and Rk (charge transfer resistance related to recombination of electrons) decreases from 32 □ to 20.9 □ while TiO2 scattering layer added in photoelectrode. Form the results of I-V characteristic, the conversion efficiency of dye-sensitized solar cell with scattering layer is obviously higher than that without scattering layer. These results indicate that added scattering layer in photoelectrode can increase the path length of the incident light in the nanocrystalline TiO2 photoelectrode, and has great help for the increase on the conversion efficiency of DSSCs.
Keywords
electrochemical electrodes; electrochemical impedance spectroscopy; electrophoresis; field emission electron microscopy; nanostructured materials; scanning electron microscopy; solar cells; titanium compounds; ultraviolet spectra; visible spectra; FE-SEM; TiO2; UV-Vis spectrophotometer; absorption wavelength; charge transfer resistance; dye-sensitized solar cells; electrochemical impedance spectroscopy; electrophoresis deposition; field emission scanning electron microscopy; incident light; nanocrystalline scattering layer; path length; photoelectrode; porous nanocrystalline structure; Absorption; Decision support systems; Electrodes; Films; Photovoltaic cells; Scattering; Electrophoresis deposition; Scattering layer; TiO2 ;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2011 IEEE 4th International
Conference_Location
Tao-Yuan
ISSN
2159-3523
Print_ISBN
978-1-4577-0379-9
Electronic_ISBN
2159-3523
Type
conf
DOI
10.1109/INEC.2011.5991724
Filename
5991724
Link To Document