Title :
Application of RCWA method to optoelectronic numerical simulations of 2D nanostructures
Author :
Semenikhin, I. ; Zanuccoli, M. ; Vyurkov, V. ; Sangiorgi, E. ; Fiegna, C.
Author_Institution :
Inst. of Phys. & Technol., RAS, Moscow, Russia
Abstract :
This paper presents some applications of a new implementation of the Fourier modal method to solve the Maxwell equations in nanostructured optoelectronic solid state devices like solar cells and image sensors. The proposed method is based on an improved and computational efficient T-matrix approach that can be extended to three-dimensional geometries. The applications reported are particularly interesting for photovoltaic devices as photon management strategies to improve the light absorption inside the semiconductor medium.
Keywords :
Fourier analysis; Maxwell equations; coupled mode analysis; nanostructured materials; optoelectronic devices; photons; 2D nanostructure; Fourier modal method; Maxwell equation; RCWA method; T-matrix approach; light absorption; nanostructured optoelectronic solid state device; optoelectronic numerical simulation; photon management strategy; photovoltaic device; rigorous coupled wave analysis; semiconductor medium; three-dimensional geometries; Absorption; Maxwell equations; Nanostructures; Optical diffraction; Optical films; Rough surfaces; Surface roughness;
Conference_Titel :
Nanoelectronics Conference (INEC), 2011 IEEE 4th International
Conference_Location :
Tao-Yuan
Print_ISBN :
978-1-4577-0379-9
Electronic_ISBN :
2159-3523
DOI :
10.1109/INEC.2011.5991728