DocumentCode :
2862365
Title :
Application of RCWA method to optoelectronic numerical simulations of 2D nanostructures
Author :
Semenikhin, I. ; Zanuccoli, M. ; Vyurkov, V. ; Sangiorgi, E. ; Fiegna, C.
Author_Institution :
Inst. of Phys. & Technol., RAS, Moscow, Russia
fYear :
2011
fDate :
21-24 June 2011
Firstpage :
1
Lastpage :
2
Abstract :
This paper presents some applications of a new implementation of the Fourier modal method to solve the Maxwell equations in nanostructured optoelectronic solid state devices like solar cells and image sensors. The proposed method is based on an improved and computational efficient T-matrix approach that can be extended to three-dimensional geometries. The applications reported are particularly interesting for photovoltaic devices as photon management strategies to improve the light absorption inside the semiconductor medium.
Keywords :
Fourier analysis; Maxwell equations; coupled mode analysis; nanostructured materials; optoelectronic devices; photons; 2D nanostructure; Fourier modal method; Maxwell equation; RCWA method; T-matrix approach; light absorption; nanostructured optoelectronic solid state device; optoelectronic numerical simulation; photon management strategy; photovoltaic device; rigorous coupled wave analysis; semiconductor medium; three-dimensional geometries; Absorption; Maxwell equations; Nanostructures; Optical diffraction; Optical films; Rough surfaces; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2011 IEEE 4th International
Conference_Location :
Tao-Yuan
ISSN :
2159-3523
Print_ISBN :
978-1-4577-0379-9
Electronic_ISBN :
2159-3523
Type :
conf
DOI :
10.1109/INEC.2011.5991728
Filename :
5991728
Link To Document :
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