Application of RCWA method to optoelectronic numerical simulations of 2D nanostructures

Author

Semenikhin, I. ; Zanuccoli, M. ; Vyurkov, V. ; Sangiorgi, E. ; Fiegna, C.

Author_Institution

Inst. of Phys. & Technol., RAS, Moscow, Russia

fYear

2011

fDate

21-24 June 2011

Firstpage

1

Lastpage

2

Abstract

This paper presents some applications of a new implementation of the Fourier modal method to solve the Maxwell equations in nanostructured optoelectronic solid state devices like solar cells and image sensors. The proposed method is based on an improved and computational efficient T-matrix approach that can be extended to three-dimensional geometries. The applications reported are particularly interesting for photovoltaic devices as photon management strategies to improve the light absorption inside the semiconductor medium.

Keywords

Fourier analysis; Maxwell equations; coupled mode analysis; nanostructured materials; optoelectronic devices; photons; 2D nanostructure; Fourier modal method; Maxwell equation; RCWA method; T-matrix approach; light absorption; nanostructured optoelectronic solid state device; optoelectronic numerical simulation; photon management strategy; photovoltaic device; rigorous coupled wave analysis; semiconductor medium; three-dimensional geometries; Absorption; Maxwell equations; Nanostructures; Optical diffraction; Optical films; Rough surfaces; Surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanoelectronics Conference (INEC), 2011 IEEE 4th International

Conference_Location

Tao-Yuan

ISSN

2159-3523

Print_ISBN

978-1-4577-0379-9

Electronic_ISBN

2159-3523

Type

conf

DOI

10.1109/INEC.2011.5991728

Filename

5991728