Title :
A selection system for MNOS capacitor memories
Author :
Raffel, J. ; Yasaitis, J.
Author_Institution :
MIT Lincoln Laboratory, Lexington, MA, USA
Keywords :
Avalanche breakdown; Breakdown voltage; Capacitance; Capacitors; Circuits; Dielectric substrates; Laboratories; Lifting equipment; Random access memory; Writing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1977.1155639
