DocumentCode

2862501

Title

A selection system for MNOS capacitor memories

Author

Raffel, J. ; Yasaitis, J.

Author_Institution

MIT Lincoln Laboratory, Lexington, MA, USA

Volume

XX

fYear

1977

fDate

16-18 Feb. 1977

Firstpage

192

Lastpage

193

Keywords

Avalanche breakdown; Breakdown voltage; Capacitance; Capacitors; Circuits; Dielectric substrates; Laboratories; Lifting equipment; Random access memory; Writing;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1977.1155639

Filename

1155639