Title :
Wireless impedance measurement of UHF RFID tag chips
Author :
Chen, Huan-Yang ; Mak, Yue Weng ; Bae, Sangchul ; Bhadkamkar, Atul ; Van der Weide, Daniel W.
Author_Institution :
Department of Electrical and Computer Engineering, University of Wisconsin-Madison, USA
Abstract :
We present wireless impedance measurement for passive UHF RFID tag chips. The measurements are performed on the tag chip when it is connected to the tag antenna in the balanced mode as it operates; neither test fixture nor matching network is needed. The chip impedance measurement in absorbing state and reflecting state by using a time-domain vector reflectometer system. The experimental results are presented for a UHF RFID Gen2 device.
Keywords :
Semiconductor device measurement; Sensitivity; Synchronization; Time domain analysis; UHF measurements; Modulator; UHF RFID; contactless measurement; impedance; wireless;
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2012.6259369
