• DocumentCode
    2863133
  • Title

    A Framework for Empirical Classifiers Comparison

  • Author

    Bin Abdullah, Mohammad Ridzuan ; Toh, Kar-Ann ; Srinivasan, Dipti

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore
  • fYear
    2006
  • fDate
    24-26 May 2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper, we seek to establish a framework for empirical comparison of performance of pattern classifiers, allowing comparisons to be made consistently across different studies. As many as 106 datasets from the University of California, Irvine, Machine Learning Repository were used as comparison benchmarks. The framework provides a clear definition of the experimental setup so that it can be unambiguously reproduced or verified by others. Multiple runs of cross-validation and tuning were employed to minimize the possibility of random effects causing much biases in the results obtained. The metrics used to compare among different classifiers are based solely on simple readings obtained through classification tests. This allows future comparisons to be made readily adaptable for inclusion of new metrics
  • Keywords
    pattern classification; Irvine; Machine Learning Repository; University of California; classification tests; empirical classifiers; pattern classifiers; random effects minimization; Application software; Biometrics; Computer security; Handwriting recognition; Information security; Information technology; Machine learning; Medical diagnosis; Software systems; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2006 1ST IEEE Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    0-7803-9513-1
  • Electronic_ISBN
    0-7803-9514-X
  • Type

    conf

  • DOI
    10.1109/ICIEA.2006.257073
  • Filename
    4026002