• DocumentCode
    2863134
  • Title

    Safe operating area for bipolar transistors

  • Author

    Gaur, Surabhi

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • Volume
    XX
  • fYear
    1977
  • fDate
    16-18 Feb. 1977
  • Firstpage
    40
  • Lastpage
    41
  • Keywords
    Bipolar transistors; Circuits; Current density; Current distribution; Electric breakdown; Equations; Semiconductor optical amplifiers; Steady-state; Temperature distribution; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1977.1155683
  • Filename
    1155683
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2863134