Title :
Multilevel I2L with threshold gates
Author :
Tich Dao ; Russell, Laura ; Preedy, D. ; McCluskey, E.
Author_Institution :
Signetics Corp., Sunnyvale, CA, USA
Keywords :
Adders; Arithmetic; Automata; Circuit testing; Detectors; Logic circuits; Logic design; Logic gates; Registers; Trigger circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1977 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1977.1155691
