• DocumentCode
    2863343
  • Title

    State of the Art 200 GHz power measurements on SiGe:C HBT using an innovative load pull measurement setup

  • Author

    Pottrain, A. ; Lacave, T. ; Gloria, D. ; Chevalier, P. ; Gaquière, C.

  • fYear
    2012
  • fDate
    17-22 June 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In this paper we report for the first time power measurements on a single ended heterojunction bipolar transistor at 200 GHz with a variation of load impedance by means of an integrated tuner. These power measurements are done on a SiGe HBT from a BiCMOS technology featuring 220/280 GHz FT/FMAX, from STMicroelectronics. Integrated impedance tuners are specially designed in order to characterize the device for various load impedance. After ensuring the linearity of the integrated tuner, SiGe HBT is characterized in non linear operation in order to extract the common characteristics such as transducer gain, output power and power available efficiency at 200 GHz. Up to now, only measurements on integrated circuit such as amplifiers have been reported in this frequency range. This is the first report of a non linear measurement on a single ended device at this frequency thanks to the integrated tuner.
  • Keywords
    BiCMOS integrated circuits; Heterojunction bipolar transistors; Linearity; Load modeling; BiCMOS; SiGe HBT; impedance tuner; load pull; millimeter wave;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
  • Conference_Location
    Montreal, QC, Canada
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-1085-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2012.6259409
  • Filename
    6259409