DocumentCode :
2863343
Title :
State of the Art 200 GHz power measurements on SiGe:C HBT using an innovative load pull measurement setup
Author :
Pottrain, A. ; Lacave, T. ; Gloria, D. ; Chevalier, P. ; Gaquière, C.
fYear :
2012
fDate :
17-22 June 2012
Firstpage :
1
Lastpage :
3
Abstract :
In this paper we report for the first time power measurements on a single ended heterojunction bipolar transistor at 200 GHz with a variation of load impedance by means of an integrated tuner. These power measurements are done on a SiGe HBT from a BiCMOS technology featuring 220/280 GHz FT/FMAX, from STMicroelectronics. Integrated impedance tuners are specially designed in order to characterize the device for various load impedance. After ensuring the linearity of the integrated tuner, SiGe HBT is characterized in non linear operation in order to extract the common characteristics such as transducer gain, output power and power available efficiency at 200 GHz. Up to now, only measurements on integrated circuit such as amplifiers have been reported in this frequency range. This is the first report of a non linear measurement on a single ended device at this frequency thanks to the integrated tuner.
Keywords :
BiCMOS integrated circuits; Heterojunction bipolar transistors; Linearity; Load modeling; BiCMOS; SiGe HBT; impedance tuner; load pull; millimeter wave;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
ISSN :
0149-645X
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2012.6259409
Filename :
6259409
Link To Document :
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