Title :
Cycle Accurate Verification of Synchronous Sequential Circuit Specified with UML 2.0 Modelling
Author :
LIN, Hai ; Zhu, Yongxin ; CHEN, Hua ; Guo, Wei
Author_Institution :
Shanghai Jiao Tong Univ., Shanghai
Abstract :
The surging complexity of modern embedded systems has been imposing challenges to designers since last decade. It is generally agreed that an approach to taming the complexity is to properly raise the level of abstraction to that of system-level designs. The Unified Modelling Language (UML) is considered appropriate to specify abstract systems. To support the gap between UML and low level hardware descriptions, a few pilot tools and methodologies were proposed by both the EDA community and the academia. However, these tools either lack support for cycle accurate system specifications in UML or ignore the efficiency issue in cycle accurate system specifications based on UML. In this paper, an improved method is proposed to efficiently specify systems at cycle accuracy by significantly simplifying clock control modelling. This method is further supported by an improved translator to convert UML 2.0 specifications into executable SystemC descriptions. We believe that our method would be a significant contribution to the electronic system level (ESL) tools.
Keywords :
Unified Modeling Language; embedded systems; formal verification; hardware description languages; logic design; sequential circuits; UML 2.0 modelling; Unified Modelling Language; cycle accurate system specification; cycle accurate verification; electronic system level tools; embedded systems; executable SystemC description; low level hardware description; synchronous sequential circuit; system-level design; Bridges; Clocks; Embedded system; Hardware; Microelectronics; Pervasive computing; Process design; Sequential circuits; System-level design; Unified modeling language;
Conference_Titel :
Intelligent Pervasive Computing, 2007. IPC. The 2007 International Conference on
Conference_Location :
Jeju City
Print_ISBN :
978-0-7695-3006-2
DOI :
10.1109/IPC.2007.84