Title :
2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513)
Abstract :
The following topics were dealt with: HEMT and PHEMT reliability; thermal measurements and resistor reliability; FET reliability; HBT reliability
Keywords :
III-V semiconductors; gallium arsenide; semiconductor device reliability; FET; GaAs; HBT; HEMT; PHEMT; reliability; resistor; thermal measurement;
Conference_Titel :
GaAs Reliability Workshop, 2000. Proceedings
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7908-0102-7
DOI :
10.1109/GAASRW.2000.902415
