2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513)

fYear

2000

fDate

5-5 Nov. 2000

Abstract

The following topics were dealt with: HEMT and PHEMT reliability; thermal measurements and resistor reliability; FET reliability; HBT reliability

Keywords

III-V semiconductors; gallium arsenide; semiconductor device reliability; FET; GaAs; HBT; HEMT; PHEMT; reliability; resistor; thermal measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

GaAs Reliability Workshop, 2000. Proceedings

Conference_Location

Seattle, WA, USA

Print_ISBN

0-7908-0102-7

Type

conf

DOI

10.1109/GAASRW.2000.902415

Filename

902415

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