DocumentCode
2864141
Title
The reliability of short length GaAs bulk resistors
Author
Sabin, Edwin ; Scarpulla, John ; Chou, Yeong-Chang
Author_Institution
TRW Inc., Redondo Beach, CA, USA
fYear
2000
fDate
2000
Firstpage
71
Lastpage
77
Abstract
The reliability of short length bulk resistors is evaluated for design current density stressing and for highly accelerated stressing. The failure modes for these different stress conditions are compared and a mechanism is proposed to explain these failure modes
Keywords
III-V semiconductors; current density; gallium arsenide; resistors; semiconductor device reliability; GaAs; current density stressing; failure modes; highly accelerated stressing; reliability; short length GaAs bulk resistors; Acceleration; Current density; Gallium arsenide; MMICs; Ovens; Resistors; Stress; Temperature; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
GaAs Reliability Workshop, 2000. Proceedings
Conference_Location
Seattle, WA
Print_ISBN
0-7908-0102-7
Type
conf
DOI
10.1109/GAASRW.2000.902422
Filename
902422
Link To Document