DocumentCode :
2864145
Title :
Development of solid-state fault isolation devices for future power electronics-based distribution systems
Author :
Vodyakho, Oleg ; Widener, Chris ; Steurer, Michael ; Neumayr, Dominik ; Edrington, Chris ; Bhattacharya, Subhashish ; Mirzaee, Hesam
Author_Institution :
Center for Adv. Power Syst., Florida State Univ., Tallahassee, FL, USA
fYear :
2011
fDate :
6-11 March 2011
Firstpage :
113
Lastpage :
118
Abstract :
This paper addresses the timely issues of modeling, and defining selection criteria for, a solid-state fault isolation device (FID) intended for use in power electronics-based distribution systems (PEDS). The paper subsequently derives the FID parameters in the PEDS envisioned under a new multi-university Engineering Research Center funded by the US National Science Foundation. When conventional circuit breakers are used in distribution systems, they have relatively long clearing times, causing feeder voltages to be reduced for a significant amount of time. Although acceptable in convention systems, this relatively long clearing time would cause significantly long, complete voltage collapses in a PEDS. Sensitive loads such as computers would fail even if the voltage returns within a few seconds. However, if a semiconductor circuit breaker were to be used instead of the conventional system, it would be able to switch fast enough to keep the time of voltage disturbances within acceptable limits. This paper discusses the management of the overvoltage resulting from very fast circuit breaker operation through the use of passive clamping devices and di/dt control during turn-off. The paper includes experimental results at medium voltage from a developed hardware prototype. In addition, a validated simulation model of a medium voltage FID was developed for future studies. Simulation results are presented.
Keywords :
circuit breakers; power distribution faults; power electronics; power supply quality; FID parameters; circuit breakers; feeder voltages; medium voltage FID simulation model; overvoltage management; passive clamping devices; power electronics-based distribution systems; semiconductor circuit breaker; solid-state fault isolation devices; voltage collapses; voltage disturbances; Circuit faults; Insulated gate bipolar transistors; Integrated circuit modeling; Logic gates; Medium voltage; Transient analysis; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location :
Fort Worth, TX
ISSN :
1048-2334
Print_ISBN :
978-1-4244-8084-5
Type :
conf
DOI :
10.1109/APEC.2011.5744584
Filename :
5744584
Link To Document :
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