• DocumentCode
    2864222
  • Title

    Low profile, low cost, new geometry integrated inductors

  • Author

    Ouyang, Ziwei ; Thomsen, Ole C. ; Andersen, Michael A E ; Björklund, Thomas

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ. of Denmark, Lyngby, Denmark
  • fYear
    2011
  • fDate
    6-11 March 2011
  • Firstpage
    150
  • Lastpage
    156
  • Abstract
    A new geometry of integrated inductors with low profile and low cost is presented in this paper. The new geometry integrates two inductors by stacking three I-cores. The middle I-core provides a shared low reluctance flux path. The air gaps are formed by separating the I-cores using copper foil windings with well-defined thickness. Many advantages and disadvantages are described in depth. In this work, inverse coupling and direct coupling in the new geometry integrated inductors have been analyzed. Coupling characteristic caused by a special saturation behavior has been emphasis. And also variable inductors caused by the special saturation behavior may be utilized in some applications. The new integrated inductors make it possible to build low-profile, low-cost, flexibility DC/DC converters, and it can be extensively designed for the low-voltage and high-current required by the modern digital applications. Experiment results obtained from a 48V-12V 30A two-phase interleaved bidirectional DC/DC converter, demonstrates the characteristic of new geometry and difference between inverse coupling and direct coupling.
  • Keywords
    DC-DC power convertors; air gaps; geometry; inductors; I-core; air gap; copper foil winding; direct coupling; integrated inductor; inverse coupling; new geometry integration; reluctance flux path; saturation behavior; two phase interleaved bidirectional DC-DC converter; Converters; Couplings; Eddy currents; Geometry; Inductors; Magnetic cores; Windings;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-8084-5
  • Type

    conf

  • DOI
    10.1109/APEC.2011.5744589
  • Filename
    5744589