DocumentCode
2864324
Title
Spectroscopic topography using terahertz pulses with a phase-retrieval algorithm
Author
Ino, Y. ; Héroux, J.B. ; Mukaiyama, T. ; Kuwata-Gonokami, M.
Author_Institution
Dept. of Appl. Phys., Univ. of Tokyo, Tokyo
fYear
2006
fDate
21-26 May 2006
Firstpage
1
Lastpage
2
Abstract
We propose and demonstrate a scheme for two-dimensional terahertz reflection imaging based on a phase-retrieval algorithm. This enables us to obtain simultaneously topographic images and the dielectric functions of a structured sample.
Keywords
spectroscopy; surface topography; terahertz wave imaging; dielectric functions; phase retrieval algorithm; spectroscopic topography; terahertz pulses; topographic images; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Infrared spectra; Optical imaging; Optical reflection; Optical surface waves; Pulse measurements; Reflectivity; Surface topography; (300.6270) Spectroscopy, far infrared;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location
Long Beach, CA
Print_ISBN
978-1-55752-813-1
Electronic_ISBN
978-1-55752-813-1
Type
conf
DOI
10.1109/CLEO.2006.4627810
Filename
4627810
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