DocumentCode :
2864412
Title :
Fault coverage of protocol test methods
Author :
Sidhu, Deepinder ; Leung, Ting-Kau
Author_Institution :
Dept. of Comput. Sci., Iowa State Univ., Ames, IA, USA
fYear :
1988
fDate :
27-31 March 1988
Firstpage :
80
Lastpage :
85
Abstract :
The authors present an estimation of fault coverage of four protocol test sequences generation techniques (T-, U-, D-, and W-methods) using Monte Carlo simulation on a simple protocol machine. The ability of a test sequence to decide whether a protocol implementation conforms to its specification heavily relies upon the range of faults that it can capture. This study shows that a test sequence produced by T-method has a poor fault detection capability whereas test sequences produced by U-, D- and W-methods have fault coverage comparable to each other and superior to that for T-method on several classes of randomly generated machines used.<>
Keywords :
Monte Carlo methods; fault location; protocols; D-method; Monte Carlo simulation; T-method; U-method; W-methods; fault coverage; protocol test methods; Automatic testing; Computer science; Fault detection; Protocols;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
INFOCOM '88. Networks: Evolution or Revolution, Proceedings. Seventh Annual Joint Conference of the IEEE Computer and Communcations Societies, IEEE
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-8186-0833-1
Type :
conf
DOI :
10.1109/INFCOM.1988.12901
Filename :
12901
Link To Document :
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