DocumentCode :
286458
Title :
Local validation of sensor signals
Author :
Yung, S.K.
Author_Institution :
Schlumberger Cambridge Res., UK
fYear :
1993
fDate :
34115
Firstpage :
42552
Lastpage :
42559
Abstract :
Presents the methodology and the architecture of a novel local sensor validation scheme. It is sufficiently simple to be implemented at the sensor level and highly flexible to accommodate a wide variety of sensors and process conditions. The proposed local sensor validation scheme has the overwhelming advantage of being sensor and application independent and is therefore economical to be mass produced as `off-the-shelf´ units, either as embedded special purpose chips within smart sensors or as `add-on´ signal conditioning modules. It provides an efficient and cost-effective method to safeguard the integrity and credibility of measurement data
Keywords :
detectors; fault location; identification; signal processing; fault detection; measurement data integrity; sensor signal local validation; signal conditioning; signal processing; smart sensors;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Fault Diagnosis and Control System Reconfiguration, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
243399
Link To Document :
بازگشت