DocumentCode :
2864627
Title :
Stratified charge memory
Author :
Erb, Dominik
Author_Institution :
Mountain View, CA, USA
Volume :
XXI
fYear :
1978
fDate :
15-17 Feb. 1978
Firstpage :
24
Lastpage :
25
Keywords :
Application specific integrated circuits; DRAM chips; Electrodes; Electrons; Manufacturing; Random access memory; Testing; Transconductance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/ISSCC.1978.1155774
Filename :
1155774
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2864627
