• DocumentCode
    2865007
  • Title

    Sub-100ps experimental Josephson interferometer logic

  • Author

    Klein, M. ; Herrell, D. ; Davidson, A.

  • Author_Institution
    IBM Research Center, Yorktown Heights, NY, USA
  • Volume
    XXI
  • fYear
    1978
  • fDate
    15-17 Feb. 1978
  • Firstpage
    62
  • Lastpage
    63
  • Abstract
    This paper will cover experimental Josephson interferometer logic gates fabricated in a 5 μm technology with 1 μW/gate dissipation, citing measured delays of 40, 95 and 120ps for OR, AND and master slave latch, respectively.
  • Keywords
    Circuit testing; Delay effects; Feeds; Inverters; Josephson junctions; Latches; Oscilloscopes; Power supplies; Superconducting integrated circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1978.1155795
  • Filename
    1155795