Title :
Switching loss estimation of high voltage power MOSFET in power factor correction pre-regulator
Author :
Young, Sungmo ; Choi, Wonsuk
Author_Institution :
Power Supply Syst. Team, HV PCIA, Bucheon, South Korea
Abstract :
Applicability of a power MOSFET in power conversion applications is determined by peak junction temperature during operation. Power losses and thermal characteristics are required to estimate the junction temperature. In this paper, switching loss of high voltage power MOSFET in hard switching application such as boost power factor correction pre-regulator is discussed. A new simple analytical switching loss model based on electrical parameters listed in the device datasheet is proposed. This method allows easy comparison of switching performance between devices from different technologies. Switching losses estimated with the proposed model are compared to measurements done in clamped inductive switching test board to demonstrate the accuracy of the proposed model.
Keywords :
power MOSFET; power factor correction; boost power factor correction pre-regulator; power MOSFET; switching loss estimation; Energy loss; Logic gates; Loss measurement; MOSFET circuits; Mathematical model; Switches; Switching loss;
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location :
Fort Worth, TX
Print_ISBN :
978-1-4244-8084-5
DOI :
10.1109/APEC.2011.5744637