Title :
A Fast Algorithm for Segmenting Defects on the Surface of QFN Packages
Author :
Wang, Mingjie ; Joo, Hyonam ; Kim, Joon-Seek ; Park, Pilgyu
Author_Institution :
Dept. of Digital Display Eng., Hoseo Univ., Chungnam, South Korea
Abstract :
There are many different types of surface defects on semiconductor integrated chips (IC´s) caused by various factors during manufacturing process, such as scratch, flash, resin bleed, melting and void. These defects must be detected and classified by an inspection system for productivity improvement and effective process control. Among these defects, in particular, resin bleed and melting are the most difficult ones to classify accurately. The shape of resin bleed and melting defects are so similar that normally it is difficult to classify the resin bleed and melting. In this paper, we propose a new segmenting method and a set of features for detecting and classifying the resin bleed and melting defects.
Keywords :
automatic optical inspection; image classification; image segmentation; monolithic integrated circuits; process control; productivity; resins; semiconductor device manufacture; semiconductor device packaging; QFN package; defect segmentation; flash; image classification; image segmentation; inspection system; manufacturing process; melting defect; process control; productivity improvement; quad flat no-leads package; resin bleed; scratch; semiconductor integrated chip; surface defect; void; Displays; Electronics packaging; Entropy; Gray-scale; Histograms; Image segmentation; Inspection; Manufacturing processes; Productivity; Resins;
Conference_Titel :
Information Engineering and Computer Science, 2009. ICIECS 2009. International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4994-1
DOI :
10.1109/ICIECS.2009.5366301