• DocumentCode
    2865122
  • Title

    Stiction in RFMEMS capacitive switches

  • Author

    Muldavin, Jeremy ; Bozler, Carl ; Wyatt, Peter

  • Author_Institution
    MIT Lincoln Laboratory, Lexington, MA 02420, USA
  • fYear
    2012
  • fDate
    17-22 June 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Stiction is a major limiter in the reliability of RF MEMS capacitive switches and varactors. There are three major categories of stiction: temporary, voltage-independent, and permanent. The permanent stiction is defined in this paper as adhesion of two parts of otherwise separate surfaces even after exposure to water, high temperature anneals, a normal range of bias conditions or restoring forces, and after long periods of relaxation (>1 year). This paper will examine the effects of bias waveform, ambient, and moisture on permanent stiction in RF MEMS capacitive switches. The mitigation solutions for permanent stiction are often different than conventional wisdom for mitigation of temporary stiction.
  • Keywords
    Dielectrics; Electrostatics; Humidity; Moisture; Nitrogen; Radio frequency; Stress; RF MEMS; adhesion; ambient; electrostatic actuation; stiction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
  • Conference_Location
    Montreal, QC, Canada
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-1085-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2012.6259509
  • Filename
    6259509