DocumentCode
2865122
Title
Stiction in RFMEMS capacitive switches
Author
Muldavin, Jeremy ; Bozler, Carl ; Wyatt, Peter
Author_Institution
MIT Lincoln Laboratory, Lexington, MA 02420, USA
fYear
2012
fDate
17-22 June 2012
Firstpage
1
Lastpage
3
Abstract
Stiction is a major limiter in the reliability of RF MEMS capacitive switches and varactors. There are three major categories of stiction: temporary, voltage-independent, and permanent. The permanent stiction is defined in this paper as adhesion of two parts of otherwise separate surfaces even after exposure to water, high temperature anneals, a normal range of bias conditions or restoring forces, and after long periods of relaxation (>1 year). This paper will examine the effects of bias waveform, ambient, and moisture on permanent stiction in RF MEMS capacitive switches. The mitigation solutions for permanent stiction are often different than conventional wisdom for mitigation of temporary stiction.
Keywords
Dielectrics; Electrostatics; Humidity; Moisture; Nitrogen; Radio frequency; Stress; RF MEMS; adhesion; ambient; electrostatic actuation; stiction;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location
Montreal, QC, Canada
ISSN
0149-645X
Print_ISBN
978-1-4673-1085-7
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2012.6259509
Filename
6259509
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