DocumentCode :
2865175
Title :
Polarization sensitive terahertz time domain spectroscopy
Author :
Castro-Camus, E. ; Lloyd-Hughes, J. ; Fraser, M.D. ; Tan, H.H. ; Jagadish, C. ; Johnston, M.B.
Author_Institution :
Dept. of Phys., Univ. of Oxford, Oxford
fYear :
2006
fDate :
21-26 May 2006
Firstpage :
1
Lastpage :
2
Abstract :
We present a terahertz radiation detector that measures both transverse components of a terahertz single cyclepsilas electric field, allowing the study of polarization dependent properties of materials. Measurements of birefringence in quartz are presented.
Keywords :
birefringence; high-speed optical techniques; infrared spectroscopy; light polarisation; terahertz wave detectors; birefringence; polarization dependent properties; terahertz radiation detector; time domain spectroscopy; transverse components; Birefringence; Electric variables measurement; Frequency; Optical polarization; Optical receivers; Optical sensors; Photoconductivity; Spectroscopy; Submillimeter wave measurements; Switches; (300.6270) Far infrared spectroscopy; (320.7080) ultrafast devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
Electronic_ISBN :
978-1-55752-813-1
Type :
conf
DOI :
10.1109/CLEO.2006.4627868
Filename :
4627868
Link To Document :
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