DocumentCode :
2865258
Title :
A V-band low-noise amplifier with 5.3-dB NF and over 8-kV ESD protection in 65-nm RF CMOS
Author :
Tsai, Ming-Hsien ; Hsu, Shawn S H ; Yeh, Tzu-Jin ; Jou, Chewn-Pu ; Hsueh, Fu-Lung
Author_Institution :
Dept. of Electrical Engineering and Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan
fYear :
2012
fDate :
17-22 June 2012
Firstpage :
1
Lastpage :
3
Abstract :
This paper presents an ESD-protected V-band (f0 at 58 GHz) low-noise amplifier (LNA) in 65-nm CMOS. Instead of using the conventional diode-based RF ESD design, a high current capability spiral inductor and a high breakdown MOM capacitor are employed as effective bi-directional ESD protection network, and also as part of the input matching by the co-design approach. The measured results demonstrate an over 8-kV HBM ESD protection level with a NF of 5.3 dB and a power gain of 17.5 dB at 58 GHz, under a power consumption of 18 mW. To our best knowledge, this LNA presents a highest ESD protection level and a lowest NF, compared with prior arts in a similar frequency range.
Keywords :
CMOS integrated circuits; Electrostatic discharges; Gain; Low-noise amplifiers; Noise; Noise measurement; Radio frequency; CMOS; electrostatic discharge (ESD); low-noise amplifier (LNA); millimeter wave (mm-Wave);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
Conference_Location :
Montreal, QC, Canada
ISSN :
0149-645X
Print_ISBN :
978-1-4673-1085-7
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2012.6259515
Filename :
6259515
Link To Document :
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