DocumentCode
2865421
Title
Camshaft timing belt reliability modelling
Author
Campean, Ioan F. ; Day, Andrew J. ; Wright, Steve
Author_Institution
Dept. of Mech. & Med. Eng., Univ. of Bradford, UK
fYear
2001
fDate
2001
Firstpage
377
Lastpage
383
Abstract
This paper presents a generic approach to life prediction modelling for automotive components, which aims to establish a correlation between the degradation mechanism, the real world customer usage profile and rig life testing. The approach is illustrated with the development of a life model for the camshaft-timing belt, for which tooth shear fatigue mechanism leads to the common cause failure mode. Previous research consisting of dynamometer studies and analytical modelling have demonstrated that the fatigue life of the timing belt can be expressed as a function of tooth load or tooth deflection, and has belt operating temperature as an explanatory variable. A stochastic linear damage accumulation process was assumed in order to derive a timing-belt life model in correlation with customer usage. The model was calibrated by using results of engine dynamometer tests. The model. is useful in many ways. It provides a simple and direct way of establishing a correlation between damage accumulation in real world conditions and belt life testing under laboratory conditions. The timing-belt life model can be used either as a life prediction tool for different usage profiles, or as a risk assessment tool in establishing the service interval
Keywords
automobiles; failure analysis; reliability; stochastic processes; timing; automotive components; camshaft timing belt reliability modelling; common cause failure mode; degradation mechanism; engine dynamometer tests; fatigue life; life prediction modelling; life prediction tool; stochastic linear damage accumulation process; tooth shear fatigue mechanism; Analytical models; Automotive components; Belts; Camshafts; Degradation; Fatigue; Life testing; Predictive models; Teeth; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2001. Proceedings. Annual
Conference_Location
Philadelphia, PA
ISSN
0149-144X
Print_ISBN
0-7803-6615-8
Type
conf
DOI
10.1109/RAMS.2001.902496
Filename
902496
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