Title :
Energy migration governs upconversion losses in Er3+-doped integrated amplifiers
Author :
Agazzi, L. ; Bradley, J.D.B. ; Ay, F. ; Kahn, A. ; Scheife, H. ; Huber, G. ; de Ridder, R.M. ; Wörhoff, K. ; Pollnau, M.
Author_Institution :
Integrated Opt. Microsyst. (IOMS) Group, Univ. of Twente, Enschede, Netherlands
Abstract :
At high Er3+ doping, electric dipole-dipole interactions between neighboring ions such as energy migration and energy-transfer upconversion (ETU) take place, thereby reducing the population inversion and negatively affecting the gain performance of the amplifier. These effects are investigated by lifetime and gain measurements respectively, in Al2O3:Er3+ waveguides and analyzed the results in the frame of the microscopic model developed by Zubenko et al.
Keywords :
doping; erbium; integrated optics; optical losses; optical waveguides; population inversion; Al2O3:Er3+ waveguides; Er3+-doped integrated amplifiers; JkJk:Er; electric dipole-dipole interactions; energy migration; energy-transfer upconversion; gain; lifetime; population inversion; upconversion loss; Erbium; Integrated optics; Luminescence; Nanotechnology; Optical amplifiers; Optical losses; Optical materials; Optical waveguides; Performance gain; Stimulated emission;
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
DOI :
10.1109/CLEOE-EQEC.2009.5196506
