DocumentCode
2865664
Title
Pseudostatistical analysis of LSI circuits
Author
Fung-Yuel Chang
Author_Institution
IBM Corp., Hopewell Junction, NY, USA
Volume
XXI
fYear
1978
fDate
15-17 Feb. 1978
Firstpage
214
Lastpage
215
Abstract
A method for simulating statistical circuit performance that uses process parameters as input variables, will be covered.
Keywords
Circuit analysis; Circuit synthesis; Integrated circuit modeling; Large scale integration; Logic circuits; Performance analysis; Resistors; Statistical analysis; Statistical distributions; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1978.1155835
Filename
1155835
Link To Document