Title :
Pseudostatistical analysis of LSI circuits
Author_Institution :
IBM Corp., Hopewell Junction, NY, USA
Abstract :
A method for simulating statistical circuit performance that uses process parameters as input variables, will be covered.
Keywords :
Circuit analysis; Circuit synthesis; Integrated circuit modeling; Large scale integration; Logic circuits; Performance analysis; Resistors; Statistical analysis; Statistical distributions; Surface resistance;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1978.1155835
