Title :
Voltage and current waveforms in power MESFETs at microwave frequencies
Author :
Sechi, F. ; Ho Huang ; Perlman, B.
Author_Institution :
RCA Labs., Princeton, NJ, USA
Abstract :
Voltage and current waveforms have been measured in power MESFETs operating with large signals at 3GHz. Amplifier linearity and device reliability can be degraded by the high instantaneous voltage observed for some tuning conditions.
Keywords :
Current measurement; Distortion measurement; MESFETs; Microwave frequencies; Oscilloscopes; Power amplifiers; Power generation; Sampling methods; Schottky barriers; Voltage measurement;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1978 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1978.1155846
