DocumentCode
2866114
Title
Isolated bi-directional full-bridge soft-switching dc-dc converter with active and passive snubbers
Author
Wu, T.-F. ; Yang, J. -G ; Kuo, C.-L. ; Lan, S.-Z.
Author_Institution
Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
fYear
2011
fDate
6-11 March 2011
Firstpage
844
Lastpage
850
Abstract
An isolated bi-directional full-bridge soft-switching dc-dc converter with high conversion ratio, high output power, soft start-up and soft-switching capability for battery charging/discharging is proposed in this paper. The use of an active flyback and two passive capacitor-diode snubbers can alleviate the voltage spike caused by the current difference between the leakage inductance of the transformer and the current-fed inductor, can reduce the current spike due to diode reverse recovery, and can reduce current and voltage stresses, while achieving near ZVS and ZCS soft-switching features for the switches on the both sides. It can improve system reliability for high power applications. In the paper, operational principle of the proposed converter will be first described, and analysis and design of the proposed converter is then presented. A 1.5 kW prototype with low-side voltage of 48 V and high-side voltage of 360 V has been implemented, from which experimental results have verified its feasibility.
Keywords
DC-DC power convertors; inductors; reliability; snubbers; transformers; zero current switching; zero voltage switching; ZCS soft-switching; ZVS soft-switching; active snubbers; battery charging/discharging; bi-directional dc-dc converter; current-fed inductor; diode reverse recovery; full-bridge dc-dc converter; leakage inductance; passive capacitor-diode snubbers; passive snubbers; power 1.5 kW; reliability; soft-switching dc-dc converter; transformer; Capacitors; Clamps; Converters; Equivalent circuits; Inductance; Snubbers; Zero current switching;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location
Fort Worth, TX
ISSN
1048-2334
Print_ISBN
978-1-4244-8084-5
Type
conf
DOI
10.1109/APEC.2011.5744693
Filename
5744693
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