Title :
A comparison of inspection strategy models for optimized tool utilization
Author_Institution :
Appl. Mater. Inc., Santa Clara, CA, USA
Abstract :
Given the complexity of fabrication as design rules shrink and the need to appropriately allocate resources, it is becoming increasingly important to determine the optimal inspection strategy. There are some simple models that can provide a general understanding of the trade-off between the specific inspection conditions and the tools required. These models can be useful to establish the risks and benefits from various allocations and inspection conditions. The implications of the different approaches can be more readily quantified based on this type of analysis, and can assist in optimization of inspection strategies
Keywords :
circuit optimisation; design for manufacture; inspection; integrated circuit manufacture; strategic planning; IC manufacture; design rules; inspection conditions; inspection strategy models; optimized tool utilization; resource allocations; Fabrication; Frequency; Inspection; Metrology; Monitoring; Production; Resource management; Sampling methods; Semiconductor device modeling; Throughput;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 2000 IEEE/SEMI
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-5921-6
DOI :
10.1109/ASMC.2000.902577