• DocumentCode
    2866650
  • Title

    1700V 4H-SiC MOSFETs and Schottky diodes for next generation power conversion applications

  • Author

    Hull, Brett A. ; Henning, Jason ; Jonas, Charlotte ; Callanan, Robert ; Olmedo, Anthony ; Sousa, Rich, Jr. ; Solovey, James M.

  • Author_Institution
    Cree, Inc., Durham, NC, USA
  • fYear
    2011
  • fDate
    6-11 March 2011
  • Firstpage
    1042
  • Lastpage
    1048
  • Abstract
    Junction barrier Schottky (JBS) diodes and MOSFETs fabricated in 4H-SiC are described. These power devices are capable of blocking in excess of 1700 V with leakage currents of less than tens of microamps at temperatures exceeding 175°C and of conducting tens of amps in the on-state. The static on-state and blocking I-V characteristics of each component are presented, along with a comparison to comparably rated Si bipolar PiN diodes and IGBTs. The dynamic performance of the 4H-SiC diodes and MOSFETs is also presented, and a fully functional 10 kW transformer isolated DC-DC power converter operating at 1000V at a switching frequency of 20 kHz is demonstrated.
  • Keywords
    Schottky diodes; insulated gate bipolar transistors; p-i-n diodes; power MOSFET; power conversion; power semiconductor diodes; semiconductor device manufacture; silicon compounds; wide band gap semiconductors; DC-DC power converter; IGBT; MOSFET; bipolar PiN diodes; frequency 20 kHz; junction barrier Schottky diodes; leakage currents; power 10 kW; power conversion; power devices; temperature 175 C; voltage 1000 V; voltage 1700 V; Converters; Insulated gate bipolar transistors; PIN photodiodes; Schottky diodes; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-8084-5
  • Type

    conf

  • DOI
    10.1109/APEC.2011.5744723
  • Filename
    5744723