• DocumentCode
    2866740
  • Title

    Implementation of best known methods

  • Author

    Foster, Jason ; Nugent, Ted ; Marcoux, Pierre

  • Author_Institution
    TEFEN, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    181
  • Lastpage
    186
  • Abstract
    As the investment required to purchase equipment for a semiconductor manufacturing line continues to increase, so does the importance of improving the utilization of this equipment. At the same time, the semiconductor market requires shorter cycle times. Traditionally, the capacity detractors that receive the most focus are tool related, but if manufacturing availability/serviceability does not keep pace with the tool availability, then no productivity gains can be realized. The capacity loss associated with staffing is the result of two general problems-loss resulting from deficient staffing levels and loss resulting from deficient operational methodology. However, the problem of determining optimal staffing levels is difficult without optimal operational methodologies in place. As a result, the first step in addressing manufacturing availability issues should be to determine and implement the best-known methods, or BKM. This paper presents a case study in the technique of using fab performance data to: 1) identify BKM; 2) implement and monitor change; and 3) measure improvement
  • Keywords
    integrated circuit manufacture; investment; personnel; production control; availability; best known methods; cycle times; fab performance data; investment; optimal operational methodologies; productivity gains; semiconductor manufacturing line; serviceability; staffing; Assembly; Availability; Data analysis; Investments; Job shop scheduling; Manufacturing; Measurement; Production facilities; Productivity; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 2000 IEEE/SEMI
  • Conference_Location
    Boston, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-5921-6
  • Type

    conf

  • DOI
    10.1109/ASMC.2000.902583
  • Filename
    902583