DocumentCode
2867069
Title
Fault impacts on solar power unit reliability
Author
Bazzi, Ali M. ; Kim, Katherine A. ; Johnson, Brian B. ; Krein, Philip T. ; Dominguez-García, Alejandro
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2011
fDate
6-11 March 2011
Firstpage
1223
Lastpage
1231
Abstract
This paper introduces a generalized reliability model of a solar power unit (SPU) based on physical characteristics including material, operating conditions, and electrical ratings. An SPU includes a photovoltaic panel, power converter, control and sensing. Possible faults in each component of the unit are surveyed and their failure rates based on physics-of-failure models are formulated. PV panel faults include possible installation faults, environmental effects, and material degradation. Power electronics faults are developed in depth for different components of a dc-dc boost converter. A system-level simulation model is developed and verified experimentally, and then used to define the survivor function of the SPU. Results show that it is important to include panel faults for accurate reliability values. The developed model is flexible and can be tailored for various SPU operating conditions, panel designs, and electrical ratings. The proposed reliability model can be extended to parallel and series interconnected topologies of multiple SPUs.
Keywords
DC-DC power convertors; photovoltaic power systems; power generation faults; power generation reliability; solar power stations; DC-DC boost converter; PV panel fault; SPU; fault impact; photovoltaic panel; physic-of- failure model; power converter; power electronic; solar power unit reliability model; system-level simulation model; Capacitors; Circuit faults; Converters; Degradation; Integrated circuit modeling; Reliability; Sensors; photovoltaic reliability; reliability modeling procedure; solar power unit;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location
Fort Worth, TX
ISSN
1048-2334
Print_ISBN
978-1-4244-8084-5
Type
conf
DOI
10.1109/APEC.2011.5744749
Filename
5744749
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