DocumentCode
2867158
Title
Non-linear, hybrid terminal behavioral modeling of a dc-based nanogrid system
Author
Cvetkovic, Igor ; Boroyevich, Dushan ; Mattavelli, Paolo ; Lee, Fred C. ; Dong, Dong
Author_Institution
Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
fYear
2011
fDate
6-11 March 2011
Firstpage
1251
Lastpage
1258
Abstract
This paper addresses the two-port network behavioral modeling of the power converters for renewable energy sources that feature non-linear static behavior. Based on the Hammerstein´s approach, two models, non-linear dc and linear ac are both run simultaneously in the simulation while the dynamic model is constantly being updated with the operating point values from the static model, in order to include non-linear static behavior. The goal here is to develop a procedure for the terminal identification, so-called black-box modeling approach when engineers do not have an access to the internal structure, control and dynamics of the converters, but through appropriate measurements can extract needed information useful later for the system level simulations and stability analysis. The hybrid models of the source, interface and load converters have been shown in this paper, as well as the system-level verification with an average model.
Keywords
nonlinear control systems; power convertors; power grids; renewable energy sources; stability; DC-based nanogrid system; black-box modeling approach; dynamic model; interface converters; load converters; nonlinear hybrid terminal behavioral modeling; nonlinear static behavior; power converters; renewable energy sources; stability analysis; system level simulations; system-level verification; two-port network behavioral modeling; Autoregressive processes; Computational modeling; Converters; Impedance; Load modeling; Mathematical model; Transfer functions; behavioral model; electronic power converters; nanogrid system; nonlinear model;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location
Fort Worth, TX
ISSN
1048-2334
Print_ISBN
978-1-4244-8084-5
Type
conf
DOI
10.1109/APEC.2011.5744753
Filename
5744753
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