DocumentCode :
2867210
Title :
Innovative 3D integration of power MOSFETs for synchronous buck converters
Author :
Herbsommer, Juan A. ; Noquil, J. ; Lopez, O. ; Jauregui, D.
Author_Institution :
Texas Instrum., Bethlehem, PA, USA
fYear :
2011
fDate :
6-11 March 2011
Firstpage :
1273
Lastpage :
1274
Abstract :
Efficiency and power loss in the microelectronic devices is a major issue in power electronics applications. The engineers are challenged every year to increase power density and at the same time reduce the amount of power dissipated in the applications to keep the maximum temperatures under specifications. This situation drives a constant demand for better efficiencies in smaller packages. Traditional approaches to improve efficiency in DC/DC synchronous buck converters include reducing conduction losses in the MOSFETs through lower RDS(ON) devices and lowering switching losses through low-frequency operation. However the incremental improvements in RDS(ON) are at a point of diminishing returns and low RDS(ON) devices have large parasitic capacitances that do not facilitate the high-frequency operation required to improve power density. The drive for higher efficiency and increased power in smaller packages is being addressed by advancements in both silicon and packaging technologies. The NexFET Power Block combines these two technologies to achieve higher levels of performance, and in half the space versus discrete MOSFETs. This article explains these new technologies and highlights their performance advantage.
Keywords :
power MOSFET; power convertors; power electronics; DC/DC synchronous buck converters; NexFET Power Block; microelectronic devices; packaging technologies; power MOSFET; power density; power electronics; switching losses; Copper; Electronic packaging thermal management; Junctions; MOSFETs; Performance evaluation; Silicon; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location :
Fort Worth, TX
ISSN :
1048-2334
Print_ISBN :
978-1-4244-8084-5
Type :
conf
DOI :
10.1109/APEC.2011.5744756
Filename :
5744756
Link To Document :
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