• DocumentCode
    2867210
  • Title

    Innovative 3D integration of power MOSFETs for synchronous buck converters

  • Author

    Herbsommer, Juan A. ; Noquil, J. ; Lopez, O. ; Jauregui, D.

  • Author_Institution
    Texas Instrum., Bethlehem, PA, USA
  • fYear
    2011
  • fDate
    6-11 March 2011
  • Firstpage
    1273
  • Lastpage
    1274
  • Abstract
    Efficiency and power loss in the microelectronic devices is a major issue in power electronics applications. The engineers are challenged every year to increase power density and at the same time reduce the amount of power dissipated in the applications to keep the maximum temperatures under specifications. This situation drives a constant demand for better efficiencies in smaller packages. Traditional approaches to improve efficiency in DC/DC synchronous buck converters include reducing conduction losses in the MOSFETs through lower RDS(ON) devices and lowering switching losses through low-frequency operation. However the incremental improvements in RDS(ON) are at a point of diminishing returns and low RDS(ON) devices have large parasitic capacitances that do not facilitate the high-frequency operation required to improve power density. The drive for higher efficiency and increased power in smaller packages is being addressed by advancements in both silicon and packaging technologies. The NexFET Power Block combines these two technologies to achieve higher levels of performance, and in half the space versus discrete MOSFETs. This article explains these new technologies and highlights their performance advantage.
  • Keywords
    power MOSFET; power convertors; power electronics; DC/DC synchronous buck converters; NexFET Power Block; microelectronic devices; packaging technologies; power MOSFET; power density; power electronics; switching losses; Copper; Electronic packaging thermal management; Junctions; MOSFETs; Performance evaluation; Silicon; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4244-8084-5
  • Type

    conf

  • DOI
    10.1109/APEC.2011.5744756
  • Filename
    5744756