DocumentCode :
2867542
Title :
A switching converter based electronic load
Author :
Upadhyay, Saurabh ; Mishra, Santanu ; Joshi, Avinash
Author_Institution :
GE Global Res., Bangalore, India
fYear :
2011
fDate :
6-11 March 2011
Firstpage :
1394
Lastpage :
1397
Abstract :
Electronic loads (E-Load) are commonly used to test power supplies. In order to test computer power supplies, the E-Load must possess an ideal controlled current source property which draws a desired load current even in the case of a very low terminal voltage of the Source-under-test (SUT). It also needs to have superior dynamic performance to simulate high slew rate load transients. This paper proposes the design of a switching converter based E-Load architecture with very large operational bandwidth. The overall architecture of the E-Load consists of a low-bandwidth converter, which functions under steady-state, and a high-bandwidth auxiliary circuit that is only active during transient load scenario. The converter circuit is realized using a novel switched-boost topology and the auxiliary circuit is realized using a MOSFET operating at the edge of saturation and linear region. A prototype is built to test the proposed architecture. The operational input voltage (SUT voltage) ranges of the prototype are between 0.5 V to 6 V. The load current range is between 0.75 A to 7 A. The results also validate the excellent dynamic characteristics of the proposed architecture.
Keywords :
power MOSFET; switching convertors; E-Load; MOSFET; computer power supplies; current 0.75 A to 7 A; electronic loads; high-bandwidth auxiliary circuit; low-bandwidth converter; source-under-test; switched-boost topology; switching converter; voltage 0.5 V to 6 V; Converters; MOSFET circuits; Power supplies; Prototypes; Steady-state; Switches; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location :
Fort Worth, TX
ISSN :
1048-2334
Print_ISBN :
978-1-4244-8084-5
Type :
conf
DOI :
10.1109/APEC.2011.5744774
Filename :
5744774
Link To Document :
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