DocumentCode
286767
Title
ESPI contouring with Fourier analysis in artwork diagnostics
Author
Spagnolo, G. Schirripa ; Paoletti, D. ; Bagini, V. ; Gori, F. ; Santarsiero, M.
Author_Institution
Dipartimento di Energetica, Univ. Dell´´Aquila, Roio Poggio, Italy
fYear
1993
fDate
13-15 Sep 1993
Firstpage
275
Lastpage
279
Abstract
A contouring technique, based on electronic speckle pattern interferometry (ESPI), is developed for surface profile measurements in conservation studies. A portable interferometer with optical fibre has been realized. The correlation contouring fringes are analyzed by a Fourier transform technique. Some preliminary tests on laboratory models are reported
Keywords
Fourier transform optics; art; electronic speckle pattern interferometry; surface topography measurement; Fourier transform technique; artwork diagnostics; conservation studies; contouring technique; correlation contouring fringes; electronic speckle pattern interferometry; laboratory models; optical fibre; portable interferometer; surface profile measurements;
fLanguage
English
Publisher
iet
Conference_Titel
Holographic Systems, Components and Applications, 1993., Fourth International Conference on
Conference_Location
Neuchatel
Print_ISBN
0-85296-578-8
Type
conf
Filename
263280
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