DocumentCode
2867836
Title
The 64K RAM and beyond
Author
Foss, R.
Author_Institution
Mosaid Technologies Inc., Ottawa, Canada
Volume
XXII
fYear
1979
fDate
14-16 Feb. 1979
Firstpage
208
Lastpage
208
Abstract
We now have 64K RAM devices and the maintenance of this increasing bit density could well represent a series of design and processing problems. Involved would be answers to such questions as: how will this new generation enter into the production system; how are the low voltage dynamic part designs to be tackled; and further, what lies beyond the 64K.
Keywords
Assembly; Instruments; Production systems; Prototypes; Random access memory; Read-write memory; Roads; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1979 IEEE International
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1979.1155964
Filename
1155964
Link To Document