Title :
Logic implementation for VLSI
Author :
Boll, H. ; Sevin, L.
Author_Institution :
Bell Laboratories, Murray Hill, NJ, USA
Abstract :
Circuit speed and design flexibility favor custom logic tailored toward specific applications. Advances in VLSI lead toward modular systems that trade component count for ease of design and testing. Panelists will discuss present and future advances in these two areas and assess their impact on the structure of new generation systems.
Keywords :
Circuit testing; Coupling circuits; Instruction sets; Integrated circuit synthesis; Integrated circuit testing; Large scale integration; Logic design; Microprocessors; System testing; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1979 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1979.1155965
