Title :
The impact of VLSI on the electronics industry
Author :
Pritchard, R. ; Terman, L.
Author_Institution :
General Electric Co., Schenectady, NY, USA
Keywords :
Circuit testing; Cost function; Electronics industry; Impedance; Logic circuits; Logic design; Logic testing; Moore´s Law; System testing; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1979 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1979.1155983
