Study of semiconductor impurity diffusion in XLPE cable insulation under electrical aging

Author

Parpal, J.-L. ; Crine, J.-P. ; Houdayer, A. ; Hinrichsen, P.

Author_Institution

Hydro-Quebec, Varennes, Que., Canada

fYear

1993

fDate

23-25 Nov 1993

Firstpage

153

Lastpage

156

Abstract

Crosslinked polyethylene (XLPE)-insulated power cables exposed to a combination of high electric stress in the presence of water are susceptible to a form of degradation known as water treeing, which is largely responsible for the premature failures encountered in extruded HV cables. The present paper reports results obtained with both two-dimensional μ-PIXE (proton induced X-ray emission) scans and NAA (neutron activation analysis) measurements on a number of samples aged under different conditions. The impurity distribution in polyethylene insulation adjacent to the interface with the inner and the outer semiconductors was investigated. No convincing evidence was found of migration of impurities (atomic number>Na) from the semiconductor into the polyethylene insulation under electric aging conditions

Keywords

X-ray chemical analysis; ageing; cable insulation; diffusion in solids; electric breakdown of solids; impurities; insulation testing; ion microprobe analysis; neutron activation analysis; organic insulating materials; polymers; power cables; XLPE; cable insulation testing; electric breakdown; electric stress; electrical aging; extruded HV cables; impurity distribution; neutron activation analysis; polyethylene; power cables; proton induced X-ray emission; semiconductor impurity diffusion; water treeing;

fLanguage

English

Publisher

iet

Conference_Titel

Power Cables and Accessories 10kV - 500kV, 1993., Third International Conference on

Conference_Location

London

Print_ISBN

0-85296-592-3

Type

conf

Filename

263338