DocumentCode

2868313

Title

FET RAMs

Author

DeSimone, R. ; Donofrio, N. ; Flur, B. ; Kruggel, R. ; Leung, Henry ; Schnadt, R.

Author_Institution

IBM Corp., Essex Junction, VT, USA

Volume

XXII

fYear

1979

fDate

14-16 Feb. 1979

Firstpage

154

Lastpage

155

Keywords

Circuits; Design optimization; FETs; Laboratories; Manufacturing processes; Metallization; Production; Productivity; Registers; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference. Digest of Technical Papers. 1979 IEEE International

Conference_Location

Philadelphia, PA, USA

Type

conf

DOI

10.1109/ISSCC.1979.1155992

Filename

1155992