Author :
DeSimone, R. ; Donofrio, N. ; Flur, B. ; Kruggel, R. ; Leung, Henry ; Schnadt, R.
Author_Institution :
IBM Corp., Essex Junction, VT, USA
Keywords :
Circuits; Design optimization; FETs; Laboratories; Manufacturing processes; Metallization; Production; Productivity; Registers; Switches;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1979 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1979.1155992
