DocumentCode :
2868446
Title :
Characterizing noise source and coupling path in Flyback converter for common-mode noise prediction
Author :
Meng, Peipei ; Zhang, Junming ; Chen, Henglin ; Qian, Zhaoming ; Shen, Yuwen
Author_Institution :
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
fYear :
2011
fDate :
6-11 March 2011
Firstpage :
1704
Lastpage :
1709
Abstract :
This paper characterized the CM noise generation and coupling mechanism to predict the CM noise in Flyback converter. The spectrum of noise sources are analyzed using bandwidth-effects-FFT and the CM noise coupling paths are identified to build up a new CM noise analysis method. With this CM noise analysis method, the total CM noise and the contributions of all the coupling paths in the converter can be predicted. The performance of CM noise suppression measures can also be diagnosed before practical implementation. This method can provide EMC designers with a costless and time saving solution to design the converter. Experimental illustrations are also included to verify the validity of the proposed CM noise analysis method. Comparison between the measured and predicted results shows that this CM noise modeling method can provide adequate prediction of the CM noise feature for the converter.
Keywords :
electromagnetic compatibility; interference suppression; power convertors; CM noise analysis method; CM noise coupling; CM noise generation; CM noise suppression; EMC designers; bandwidth-effects-FFT; common-mode noise prediction; coupling mechanism; electromagnetic compatibility; flyback converter; Capacitance; Converters; Couplings; Electromagnetic interference; Integrated circuit modeling; MOSFET circuits; Noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2011 Twenty-Sixth Annual IEEE
Conference_Location :
Fort Worth, TX
ISSN :
1048-2334
Print_ISBN :
978-1-4244-8084-5
Type :
conf
DOI :
10.1109/APEC.2011.5744825
Filename :
5744825
Link To Document :
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