• DocumentCode
    2868461
  • Title

    Efficient signature-based fault diagnosis using variable size windows

  • Author

    Clouqueur, T. ; Saluja, Krishan Kumar

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    391
  • Lastpage
    396
  • Abstract
    A technique for signature based diagnosis using windows of different sizes is presented. It allows one to obtain increased diagnostic information from a given test at a lower cost, without additional hardware. Existing techniques that use signature based methods are limited by occurrences of aliasing that can lead to failure in the diagnosis process. The new approach proposed in this paper uses windows of different sizes based on the distribution of faults in a circuit and reduces the probability of aliasing in a window Signature analysis can then give reliable information about failing and non-failing vectors. The effectiveness of the proposed method is evaluated by experiments conducted on ISCAS benchmark circuits. The results show that the proposed method can improve the diagnostic resolution and can reduce the cost of diagnosis
  • Keywords
    automatic testing; built-in self test; fault diagnosis; integrated circuit testing; logic testing; ISCAS benchmark circuits; aliasing; circuit faults; cost of diagnosis; diagnostic information; diagnostic resolution; failing vectors; nonfailing vectors; signature-based fault diagnosis; variable size windows; Automatic testing; Circuit faults; Circuit testing; Content addressable storage; Costs; Dictionaries; Failure analysis; Fault diagnosis; Hardware; Information analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2001. Fourteenth International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-0831-6
  • Type

    conf

  • DOI
    10.1109/ICVD.2001.902690
  • Filename
    902690