Title :
A parallel built-in self-diagnostic method for embedded memory buffers
Author :
Huang, D.C. ; Jone, W.B. ; Das, S.R.
Author_Institution :
Dept. of Comput. Sci., Nat. Chung-Cheng Univ., Taiwan
Abstract :
In this paper, we propose a new built-in self-diagnosis (BISD) method to simultaneously diagnose and repair spatially distributed memory modules with different sizes. Based on the serial interfacing technique, the serial fault masking effect is observed and a bi-directional serial interfacing technique is proposed to deal with such an issue. By tolerating redundant read/write operations, we develop a new march algorithm called DiagRSMarch to achieve the goals of low hardware overhead, tolerable diagnostic time, and high diagnostic coverage
Keywords :
VLSI; buffer storage; built-in self test; fault diagnosis; modules; redundancy; BISD; DiagRSMarch; bi-directional serial interfacing technique; diagnostic coverage; diagnostic time; embedded memory buffers; hardware overhead; march algorithm; parallel built-in self-diagnostic method; redundant read/write operations; serial fault masking effect; spatially distributed memory modules; Bidirectional control; Degradation; Fabrication; Fault diagnosis; Hardware; Neural networks; Random access memory; Reduced instruction set computing; Testing; Very large scale integration;
Conference_Titel :
VLSI Design, 2001. Fourteenth International Conference on
Conference_Location :
Bangalore
Print_ISBN :
0-7695-0831-6
DOI :
10.1109/ICVD.2001.902691
