Title :
Synthesis of transparent circuits for hierarchical and system-on-a-chip test
Author :
Chakrabarty, Krishnendu ; Mukherjee, Rajatish ; Exnicios, Andrew
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Abstract :
We propose a synthesis for test approach in which multiplexers are embedded in the behavioral models of the various modules constituting a hierarchical system. This approach can also be applied to system-on-a-chip designs in which synthesizable models are available for the embedded cores. The embedded multiplexers provide complete, single-cycle transparency, thereby offering a straightforward yet effective solution to the problems of test data propagation and test vector translation. In order to determine I/O bitwidths for single-cycle transparency, a global analysis is carried out using a graph-theoretic framework and an optimization method based on integer linear programming. Case studies using high-level synthesis benchmarks and an industrial-strength benchmark show that synthesis for transparency introduces very little area and performance overhead
Keywords :
application specific integrated circuits; circuit optimisation; graph theory; high level synthesis; integer programming; integrated circuit testing; linear programming; logic testing; area overhead; behavioral models; embedded cores; embedded multiplexers; global analysis; graph-theoretic framework; high-level synthesis benchmarks; industrial-strength benchmark; integer linear programming; optimization method; performance overhead; single-cycle transparency; synthesis for test approach; system-on-a-chip designs; system-on-a-chip test; test data propagation; test vector translation; transparent circuits; Benchmark testing; Circuit synthesis; Circuit testing; Hierarchical systems; Integer linear programming; Multiplexing; Optimization methods; System testing; System-on-a-chip; Vectors;
Conference_Titel :
VLSI Design, 2001. Fourteenth International Conference on
Conference_Location :
Bangalore
Print_ISBN :
0-7695-0831-6
DOI :
10.1109/ICVD.2001.902696