DocumentCode
2868972
Title
THE EFFECT OF DIFFERENT TEST SETS ON QUALITY LEVEL PREDICTION: WHEN IS 80% BETTER THAN 90%?
Author
Maxwell, Peter C. ; Aitken, Robert C. ; Johansen, Vic ; Chiang, Inshen
fYear
1991
fDate
26-30 Oct 1991
Firstpage
358
Keywords
Benchmark testing; Circuit faults; Circuit testing; Digital integrated circuits; Economic forecasting; Fabrication; Integrated circuit testing; Laboratories; Manufacturing; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1991, Proceedings., International
ISSN
1089-3539
Print_ISBN
0-8186-9156-5
Type
conf
DOI
10.1109/TEST.1991.519695
Filename
519695
Link To Document