Title :
THE EFFECT OF DIFFERENT TEST SETS ON QUALITY LEVEL PREDICTION: WHEN IS 80% BETTER THAN 90%?
Author :
Maxwell, Peter C. ; Aitken, Robert C. ; Johansen, Vic ; Chiang, Inshen
Keywords :
Benchmark testing; Circuit faults; Circuit testing; Digital integrated circuits; Economic forecasting; Fabrication; Integrated circuit testing; Laboratories; Manufacturing; Production;
Conference_Titel :
Test Conference, 1991, Proceedings., International
Print_ISBN :
0-8186-9156-5
DOI :
10.1109/TEST.1991.519695
