• DocumentCode
    2869373
  • Title

    The harsh environment robust micromechanical technology (HERMiT) program: Success and some unfinished business

  • Author

    Nguyen, Clark T -C

  • Author_Institution
    Dept. of EECS, Univ. of California at Berkeley, 94720, U.S.A.
  • fYear
    2012
  • fDate
    17-22 June 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This invited paper summarizes the history behind the creation, execution, and eventual success and commercial impact of DARPA´s Harsh Environment Robust Micromechani-cal Technology (HERMiT) program. Originally proposed in late 2002 as a program to explore micro-scale environmental control via new packaging technology, the HERMiT program morphed into a vehicle to explore and address reliability and long-term stability issues for microelectromechanical devices, such as RF switches, high-Q resonators, and gyroscopes. In the end, packag-ing indeed surfaced as an important key to achieving the best cycle lifetimes seen to date for RF MEMS switches, as well as unprecedented frequency stability for micromechanical resona-tors that eventually enabled some of the MEMS-based timing oscillator products now shipping in volumes approaching 100 million parts per year.
  • Keywords
    Indexes; Micromechanical devices; Radio frequency; Switches; RF MEMS switch; gyroscope; micromechanical resonator; reliability; stability; wafer-scale packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International
  • Conference_Location
    Montreal, QC, Canada
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-1085-7
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2012.6259750
  • Filename
    6259750