DocumentCode
2869504
Title
The effect of sea level cosmic rays on electronic devices
Author
Ziegler, Jens ; Lanford, W.
Author_Institution
IBM Research Center, Yorktown Heights, NY, USA
Volume
XXIII
fYear
1980
fDate
13-15 Feb. 1980
Firstpage
70
Lastpage
71
Abstract
The evaluation of the effects of cosmic rays on computer memories and its application to typical memory devices will be discussed. Conclusions indicate that cosmic ray nucleons and muons could have a significant effect on the next generation of computer memory circuitry. Error rates increase rapidly with altitude, offering the potential of accelerated testing to make electronic equipment less sensitive to the cosmic rays.
Keywords
Charge measurement; Cosmic rays; Current measurement; Electronic circuits; Ionization; Laboratories; Physics; Sea level; Sea measurements; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1980.1156060
Filename
1156060
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