• DocumentCode
    2869504
  • Title

    The effect of sea level cosmic rays on electronic devices

  • Author

    Ziegler, Jens ; Lanford, W.

  • Author_Institution
    IBM Research Center, Yorktown Heights, NY, USA
  • Volume
    XXIII
  • fYear
    1980
  • fDate
    13-15 Feb. 1980
  • Firstpage
    70
  • Lastpage
    71
  • Abstract
    The evaluation of the effects of cosmic rays on computer memories and its application to typical memory devices will be discussed. Conclusions indicate that cosmic ray nucleons and muons could have a significant effect on the next generation of computer memory circuitry. Error rates increase rapidly with altitude, offering the potential of accelerated testing to make electronic equipment less sensitive to the cosmic rays.
  • Keywords
    Charge measurement; Cosmic rays; Current measurement; Electronic circuits; Ionization; Laboratories; Physics; Sea level; Sea measurements; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1980 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1980.1156060
  • Filename
    1156060